CombiscopeXploRA原子力拉曼联用系统

Combiscope XploRA 原子力- 拉曼联用系统
HORIBA Scientific(Jobin Yvon光谱技术）
堀场

Combiscope XploRA 是一款高度集成原子力拉曼系统。它可使用高达1.4 数值孔径的100 倍物镜，非常适合透明样品的测试。此外，它也为其它探测方法提供了开放空间。

产品特点

• 全自动操作，数分钟内即可开始测试

• 适合拉曼红光或近红外激发（AFM 反馈激光为1300nm）

• 与倒置显微镜底部耦联

• 可使用高达1.4NA 值的100 倍物镜

• 全自动系统

• TERS 快速成像

• 同一软件操作

CombiScope Scanner and Base 扫描器和基座

样品扫描范围：100 µm x 100 µm x 20 µm (±10 %); 可选 200 µm x 200 µm x 20 µm (± 10 %)

扫描类型：样品XY非线性 0.05 %; Z方向非线性 0.05 %

噪声：

0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on

0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off

< 0.1 nm RMS Z capacitance sensor in 1000 Hz bandwidth

X, Y, Z运动

Digital closed loop control for X, Y, Z axes

Motorized Z approach range 1.3 mm

Motorized XY head positioning 1.6 mm x 1.6 mm, 1 µm resolution

Sample size Maximum 50.8 mm x 50.8 mm, 5 mm thickness and up to 100 mm x 100 mm with special holder

Sample positioning range 25 mm x 25 mm

AFM 探头Head

Laser wavelength 1300 nm, non-interfering with spectroscopic detector

Registration system noise Down to < 0.03 nm

Alignment Fully automated cantilever and photodiode alignment

Probe access Free access to the probe for additional external manipulators and probes

SPM测量模式

Contact AFM in air/(liquid optional) 

Conductive AFM (optional) 

Nanolithography

Semicontact AFM in air/(liquid optional)

Magnetic Force Microscopy (MFM) 

Nanomanipulation

Non -contact AFM 

Kelvin Probe (Surface Potential Microscopy, SKM, KPFM) 

STM (optional)

Phase imaging 

Capacitance and Electric Force Microscopy (EFM) 

Photocurrent Mapping (optional)

Lateral Force Microscopy (LFM 

Force curve measurement 

Volt-ampere characteristic measurements (optional)

Force Modulation 

Piezo Response Force Microscopy (PFM)

Liquid Cell (optional)液体池（选项）

Fixing of Petri dish 35 mm

Sample positioning range 10 x 10 mm, 1 µm resolution

Volume of liquid: 3 ml

Capability of liquid exchange

Autoclave and ultrasonic cleaning of cell parts

Temperature Control for Liquid Cell (optional)液体池温控（可选）

Heating up to 60° C

Cooling below room temperature down to 5° C

Sample positioning range 5 x 5 mm

Positioning resolution 1 µm

Spectroscopy Modes光谱模式

共聚焦拉曼，荧光，发光成像和光谱Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy 

针尖增强荧光Tip-Enhanced Fluorescence (TEFS)

针尖增强拉曼Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes 

近场光扫描微光谱和光谱Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

导电ARM单元Conductive AFM Unit (optional)

电流范围Current range

100 fA ~ 10 µA

3 current ranges (1 nA, 100 na and 10 µA) switchable from the software

可选附件和微光谱Optical Access and Microscope

Bottom optical access：Up to 1.49 NA oil immersion objective

Cloosed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment

Range 20 µm x 20 µm x 15 µm

Resolution: 1 nm

Inverted microscope：Research grade Nikon Ti-u, with optional Dark Field, DIC, Epi fluorescence and more

光谱仪Spectrometer

Fully automated XploRA INV compact inverted micro-spectrometer, functional as stand-alone micro-Raman microscope

Wavelength range 50 cm -1  to 4000 cm -1

Gratings 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)

Automation Fully motorized, software controlled operation

检测Detection

Full range of CCD detectors and EMCCDs

激光源Laser Sources

Typical wavelength 532 nm, 638 nm, 785 nm. Other wavelength available on request

自动化Automation

Fully automated laser and filter switching for up to 3 simultaneous lasers

Laser polarization selection and spectral analyzer options for all wavelengths

软件Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search 

functionalities.