MFP3DInfinity原子力显微镜

MFP-3D Infinity

无限应用，无穷潜力

MFP-3D Infinity是MFP-3D Infinity家族中的旗舰产品。它不仅将其历代产品卓越的多功能性与更高的性能，更强大的功能相结合，还拥有一套重新设计的系统框架，适用于未来拓展。MFP-3D Infinity可以使您日常的成像工作变得更简单，更迅速地完成，还可以为您zei具雄心地 项目提供支持。

为什么选择 MFP-3D Infinity？

• 对于大型样本AFM来说，性能卓越

• 多种选择，灵活性强，您的想法随时实现

• 便于适用，无性能损耗

• 提供行业内zei好地 用户支持

包含模式：

• 接触模式

• DART™脉冲频率调制

• 高次谐波成像模式（Dual AC™）

• 双频共振追踪压电模式（DART）

• 静电力显微技术（EFM）

• 液态成像

• 力曲线模式

• 力映射模式（力曲线阵列模式）

• 力调制模式

• 调频模式

• 开尔文探针力显微镜（KPFM）

• 侧向力模式（LFM）

• 损耗角正切模式

• 改进调频制模式（MFM）

• MicroAngelo™（纳米光刻／纳米操控）

• 相位成像模式

• 压电响应力显微镜模式(PFM)

• 光谱开关PFM

• 轻敲模式（交流电模式）

• 轻敲模式（交流电模式）搭配Q控制器

• 矢量PFM

MFP-3D Infinity™原子力显微镜是MFP-3D 系列AFM的旗舰款，也是该系列中性能更为出色的产品。Infinity拥有丰富的成像模式和配件，还具有多功能性、以及一个可确保未来扩展的系统架构。MFP-3D Infinity能够让您的常规成像任务变得更简便、更快速，同时协助您完成更具挑战性的科研项目。

性能稳定的AFM，支持大尺寸样品

提供多种选择和丰富的模式，协助您将构思转化为结果

易于使用，又不降低灵活性

提供专业的售后支持和服务

特点：

性能稳定的，支持大尺寸样品

Superior mechanical stability—Noise floor is 33% lower than any other large-sample

Lowest-noise control electronics

Low noise, stability position sensors

Excellent acoustic vibration isolation

Robust construction, dependable performance that thrives in busy labs

提供多种选择和丰富的模式，协助您将构思转化为结果

Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)

Unmatched range of nanoelectrical and electromechanical characterization modes

Numerous environmental accessories for control

Controlled gas or liquid environment options that are simple, safe, and effective

Unique accessories for applying external forces to a wide range of samples

易于使用，又不降低灵活性

ModeMaster™ automatically configures software for selected mode

GetReal™ automatically calibrates the cantilever spring constant and sensitivity

GetStarted™ automatically sets optimal parameters for tapping mode imaging

提供专业的售后支持和服务

Includes a two-year comprehensive warranty

No-charge technical support and expert applications support for life

Extended warranty and repair costs are the lowest in the industry

Precise, Ultra-low Noise

Closed-loop Scanner

X&Y range 90 µm

X&Y sensors<150 pm noise

Z range >15 µm (>40 µm option)

Z sensor<35 pm noise

Low-noise, High Bandwidth OpticaLever

Cantilever deflection sensing uses an inverted

configuration (incident beam off-vertical) to dramatically

reduce interference from light reflected by the sample.

Light source Low-coherence infrared (860 nm)

superluminescent diode, FDA/IEC Class 1M (Non-hazardous)

DC detector noise<10 pm

Detector bandwidth 7 MHz

High Resolution System Performance

DC height noise<20 pm

AC height noise<20 pm

Top-view Optics

Resolution Better than 5 µm

Camera Color, 5 megapixewith digitapan & zoom

Illumination

Type Köhler with aperture and field diaphragms

Source White LED fiber-coupled with SMA connector

Intensity Software controlled

Sample Stage

Sample size Up to 80 mm diameter

Sample thickness Up to 10 mm (up to 27 mm option)

(Noise measurements are quoted as the average deviation

measured with a 1 kHz bandwidth over a ful10 second

period. Specifications assume required vibration and acoustic

isolation in an appropriate laboratory environment.) 

Acoustic and Vibration Isolation

Enclosure

A custom enclosure fully integrates both acoustic and

vibration isolation, part of the Infinity controller electronics,

and the accessory expansion module bay.

Vibration isolation Active vibration isolation provides

superior damping without the instability and compressed

air requirements of passive isolation tables.

Acoustic isolation Rigid, highly damped design provides

effective isolation of acoustic noise in typicalaboratories.

Ergonomics The door of the enclosure effortlessly swings

to the side to open and is reversible to accommodate different

laboratory floor plans. A smaller access window allows users

to reach into the enclosure to make adjustments.

Included Operating Modes

Contact mode; DART™ PFM; DuaAC™; DuaAC Resonance

Tracking (DART™); Electric force microscopy (EFM); Fluid

imaging; Force curve mode; Force mapping mode (force

volume); Force modulation; Frequency modulation; Kelvin

probe force microscopy (KPFM); Lateraforce mode (LFM);

Loss tangent imaging; Magnetic force microscopy (MFM);

MicroAngelo (nanolithography / nanomanipulation); Phase

imaging; Piezoresponse force microscopy (PFM); Switching

spectroscopy PFM; Tapping mode (AC mode); Tapping mode

(AC mode) with Q control; Vector PFM

OptionaOperating Modes

AM-FM Viscoelastic Mapping Mode; Band Excitation; Contact

Resonance Viscoelastic Mapping Mode; Fast Force Mapping

Mode; Instrumented nanoindentation; Conductive AFM

(CAFM) with ORCA™ and Eclipse™ mode; Current mapping

with Fast Force Mapping; ElectrochemicaStrain Microscopy

(ESM); High voltage PFM; iDrive™ (magnetically actuated

AC mode in liquid); Nanoscale Time Dependent Dielectric

Breakdown (nanoTDDB); Scanning ThermaMicroscopy

(SThM); Scanning Tunneling Microscopy (STM); Ztherm™

Modulated ThermaAnalysis

Service and Support

Warranty Fultwo-year comprehensive warranty

Support No-charge technicasupport and expert

applications support for the lifetime of the AFM

Temperature and EnvironmentaControl

PolyHeater™ – heating up to 400°C

CoolerHeater – heat or coo-30° to 120°C

Humidity Sensing Cel– sealed humidity chamber

ExternaDriving Forces

Variable Field Module 2 – magnetic fields up to 0.8 T

NanoRack™ – tensile or compressive stress up to 80 N

High Voltage Field – apply up to ±150 V

Probe Station – apply your own electric signals to samples

Controlled Gas or Liquid Environments

Closed Fluid Cel– perfuse gases or liquids

Fluid CelLite – operate in liquid without perfusion

ElectricaClosed Cel– controlled gas environment

BioHeater™ – coverslip-based heater for liquids

Petri Dish Holder – minimizes evaporation from dish

Petri Dish Heater – also heats dish up to 80°C

MicroFlow Cel– smalvolume fluid exchange

Electrochemistry Cel– also available with heating

参考：

　　显微镜：第三代平板式、全闭环先进扫描技术平台

　　1.扫描器：横向(X-Y)范围90&micro;m×90&micro;m;竖直(Z)范围15&micro;m (标配型)或者40&micro;m(选配型)

　　2. 噪声：垂直(Z)方向上的RMS值<0.3埃 (平均偏差 (Adev) 在0.1Hz-1kHz 带宽)

　　3. 样品大小：直径≤100mm, 厚度≤20mm

　　4.控制器:全数字化、模块化、可编程控制器，其数据处理能力仅仅受限于计算机的的内存大小(允许连续一千万点力曲线和>8190 x 8190点高密度像素成像)。允许在5MHz的速度下连续获得200万以上的数据。

　　5. MFP-3D可以实现全面的SPM表面表征技术，包括：

　　•轻敲模式(Tapping Mode AFM)-拥有Q-control控制技术

　　•接触模式(Contact Mode AFM)

　　•定量相位成像模式(Phase Imaging)

　　•横向力模式(laterial Force Microscopy, LFM)

　　•磁场力显微技术(Magnetic Force Microscopy, MFM)

　　•扫描隧道显微技术(Scanning Tunneling Microscopy, STM)

　　• 力调制(Force Modulation)

　　• 静电力显微技术(Electric Force Microscopy, EFM)

　　• 表面电势显微术(Surface Potential Microscopy)

　　• 动态和静态力曲线测试(Force-Distance)

　　•力阵列测量(Force Volume Measurement)

　　• 纳米压痕/划痕(Nanoindenting/Scratching)

　　• 超高分辨率导电显微技术(ORCA)

　　• 压电响应模式(Piezo Respnance mode, PR mode)