布鲁克ContourGTK三维光学显微镜

ContourGT-K 3D Optical Microscope

Combining exceptional profiling performance, convenience, and affordability in one benchtop instrument

The ContourGT-K 3D Optical Microscope is the standard in capability and value for surface profilers. With a variety of 2D/3D measurements, high-resolution imaging, and a user-friendly interface, the system offers uncompromised metrology in a simplified package with a compact footprint. 

提供最全面的表面测量与成像技术

性能卓越、操作简便的桌上型三维光学显微镜

ContourGT-K三维光学显微镜完善了表面测量和分析的新标准，这套测量系统拥有工业领先的测量性能和灵活性，采用专利白光干涉技术，超大视野内埃级至毫米级的垂直计量范围，具有业界最高的垂直分辨率和测量重复性。

凭借其独特的直观用户界面和功能最全的自动化检测、分析功能，方便用户快速高效的获得材料粗糙度、二维/三维表面分析以及高分辨成像，广泛应用于LED、太阳能电池、薄膜材料、MEMS、精密机械零部件、摩擦磨损等各个领域，满足各种表面测量的实际需求。

The ContourGT-K 3D Optical Microscope sets a new industry standard in design and cost for surface metrology performance. With exceptional roughness and 2D/3D measurement capabilities, high esolution imaging and the industry’s most advanced user friendly interface, the system offers uncompromised metrology in a simplified package with a compact footprint. The gage-capable ContourGT-K provides intuitive access to an extensive library of pre-programmed filters and analyses for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications. Boasting unmatched Z-axis resolution and accuracy, the ContourGT-K provides all of the industry recognized advantages of Bruker’s proprietary white light interferometry without the deficiencies of conventional confocal and standard digital microscopes.

Superior Imaging and Resolution

• Best Z resolution independent of magnification

• Largest field of view

• High-stability, vibration-tolerant design

• High-resolution and color camera options

Powerful Measurement and Analysis

• Streamlined interface and intuitive workflow

• Real-time automated measurement optimization

• Extensive library of filters and analysis options

• Customized analysis reporting

Unparalleled Metrology

The ContourGT-K is the culmination of over three decades of proprietary optical innovation and industry leadership in non-contact surface metrology, characterization and imaging. The ContourGT-K exhibits the low noise, high speed, accuracy, and precision results that quantitative metrology requires. With the use of multiple objectives and integrated feature recognition, features can be tracked over a variety of fields of view and at sub-nanometer vertical resolution, providing scale-independent results for quality control and process monitoring applications in very diverse industries.

Unmatched Value and Scalable Options

With thousands of customized analyses and Bruker's simple, powerful Vision64® user interface, the ContourGT-K is optimized for productivity in the lab and on the factory floor. The hardware and software combine to provide streamlined access to top optical performance at price points thousands of dollars lower than is possible for comparable metrology capability. In addition, the ContourGT-K can be significantly extended past the standard platform with field-upgradable addons and application-specific customization packages:

• Fully automated turret and programmable X, Y, Z movement

• Application-specific productivity software